Background and objectives. Dental implants are commonly used in dental therapeutics, but dental practitioners only have limited information about the characteristics of the
implant materials they take the responsibility to place in their patients. The objective of this work is to describe the chemical and morphological characteristics of 62 implant surfaces available on the market and establish their respective Identification (ID) Card, following the Implant Surface Identification Standard (ISIS). In this fourth part, surfaces produced through other subtractive processes (resorbable blasting media RBM, dual acid-etching DAE, subtractive impregnation micro/nanotexturization SIMN and others) were investigated.
Materials and Methods. Twenty different implant surfaces were characterized: MTX (Zimmer, Carlsbad, CA, USA), Biohorizons RBT (Biohorizons, Birmingham, AL, USA), OsseoFix (ADIN, Afula, Israel), Ossean (Intra-Lock, Boca Raton, Florida, USA), Blossom Ossean (Intra-Lock, Boca Raton, Florida, USA), Osstem RBM (Osstem implant Co., Busan, Korea), Ossean G23 ELI (Intra-Lock, Boca Raton, Florida, USA), SBM body (Implant Direct LLC, Calabasas, CA, USA), MegaGen RBM (MegaGen Co., Seoul, Korea), DIO BioTite-M (DIO Corporation, Busan, Korea), Blue Sky Bio RBM (Blue Sky Bio, Grayslake, IL, USA), Anthogyr BCP (Anthogyr, Sallanches, France), Shinhung RBM+ (Shinhung Co., Seoul,Korea), Neobiotech CMI (Neobiotech Co., Seoul, Korea), Osseospeed (AstraTech, Mölndal, Sweden), 3I OsseoTite (Biomet 3I, Palm Beach Gardens, FL, USA), 3I OsseoTite 2 (Biomet 3I, Palm Beach Gardens, FL, USA), Neoss ProActive (Neoss Ltd, Harrogate, UK), BTI Interna (Biotechnology Institute, Vitoria, Spain), Winsix WMRS (BioSAF IN, Ancona, Italy). Three samples of each implant were analyzed. Superficial chemical composition was analyzed using XPS/ESCA (X-Ray Photoelectron pectroscopy/Electron Spectroscopy for Chemical Analysis) and the 100nm in-depth profile was established using Auger Electron Spectroscopy (AES). The microtopography was quantified using optical profilometry (OP). The general morphology and the nanotopography were evaluated using a Field Emission-Scanning
Electron Microscope (FE-SEM). Finally, the characterization code of each surface was established using the ISIS, and the main characteristics of each surface were summarized in areader-friendly ID card.
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